Results for "A.P.E.Research"


AFM - atomic force microscopy

The AFM, atomic force microscopy is a scanning probe microscopy, to analyze high resolution (at the nanometer level) the three-dimensional morphology of a sample. Microscopy SECM (Scanning Electrochemical Microscopy and Scanning Electrochemical Microscopy) uses a microelectrode to measure the curren...

Atomic Force Microscope, AFM, electrochemical properties of the scanning electrochemical microscopy, SECM

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